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Publications

Scientific research is one of the key building blocks of the knowlEdge project and enables us to (i) utilize state-of-the-art methods and concepts and (ii) report on our key findings and contributions to the scientific community. The following list will eventually grow over the course of its project and reflect the publicly available scientific progress we made. Each publication includes at least one project member.

2022

knowlEdge Project,

knowlEdge Project -- Concept, Methodology and Innovations for Artificial Intelligence in Industry 4.0 Online

2022, visited: 06.04.2022.

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2021

Berns, Fabian; Huwel, Jan David; Beecks, Christian

LOGIC: Probabilistic Machine Learning for Time Series Classification Inproceedings

In: 2021 IEEE International Conference on Data Mining (ICDM), pp. 1000–1005, IEEE, Auckland, New Zealand, 2021, ISBN: 978-1-66542-398-4.

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Alvarez-Napagao, Sergio; Ashmore, Boki; Barroso, Marta; Barrué, Cristian; Beecks, Christian; Berns, Fabian; Bosi, Ilaria; Chala, Sisay Adugna; Ciulli, Nicola; Garcia-Gasulla, Marta; Grass, Alexander; Ioannidis, Dimosthenis; Jakubiak, Natalia; Köpke, Karl; Lämsä, Ville; Megias, Pedro; Nizamis, Alexandros; Pastrone, Claudio; Rossini, Rosaria; Sànchez-Marrè, Miquel; Ziliotti, Luca

knowlEdge Project -- Concept, Methodology and Innovations for Artificial Intelligence in Industry 4.0 Inproceedings

In: IEEE 19th International Conference on Industrial Informatics (INDIN), pp. 1-7, IEEE, 2021.

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Berns, Fabian; Strueber, Joschka Hannes; Beecks, Christian

Local Gaussian Process Model Inference Classification for Time Series Data Inproceedings

In: Zhu, Qiang; Zhu, Xingquan; Tu, Yicheng; Xu, Zichen; Kumar, Anand (Ed.): SSDBM 2021: 33rd International Conference on Scientific and Statistical Database Management, Tampa, FL, USA, July 6-7, 2021, pp. 209–213, ACM, 2021.

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Hüwel, Jan David; Berns, Fabian; Beecks, Christian

Automated Kernel Search for Gaussian Processes on Data Streams Inproceedings

In: 2021 IEEE International Conference on Big Data (Big Data), Orlando, FL, USA, December 15-18, 2021, pp. 3584–3588, IEEE, 2021.

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